JCP Communication on Conical Intersections at Semiconductor Defects

Check out Yinan’s communication in J. Chem. Phys. demonstrating that conical intersections in models of defects at the silicon-silicon oxide interface facilitate ultrafast non-radiative decay.  Decay via such conical intersections may play a role in determining the photoluminescence spectrum of oxidized silicon nanoparticles.

Also, don’t forget to take a look at his recent J. Chem. Phys. article on preventing symmetry breaking in multireference wavefunctions.

Leave a Reply

Please log in using one of these methods to post your comment:

WordPress.com Logo

You are commenting using your WordPress.com account. Log Out / Change )

Twitter picture

You are commenting using your Twitter account. Log Out / Change )

Facebook photo

You are commenting using your Facebook account. Log Out / Change )

Google+ photo

You are commenting using your Google+ account. Log Out / Change )

Connecting to %s

Blog at WordPress.com.

Up ↑