JCP Communication on Conical Intersections at Semiconductor Defects

Check out Yinan’s communication in J. Chem. Phys. demonstrating that conical intersections in models of defects at the silicon-silicon oxide interface facilitate ultrafast non-radiative decay.  Decay via such conical intersections may play a role in determining the photoluminescence spectrum of oxidized silicon nanoparticles.

Also, don’t forget to take a look at his recent J. Chem. Phys. article on preventing symmetry breaking in multireference wavefunctions.

Blog at

Up ↑